SPM

Scanning probe microscopy in fact describes a family of microscope applications where a sharp probe is scanned across a surface. The probe may be sensitive to the electrical, magnetic, optical, frictional or other property of the interaction between the surface and the probe tip.

Contact Mode Atomic Force Microscopy (AFM)

This technique measures surface topography by sliding the probe tip across the sample surface. It can provide a high-resolution topographic map of the surface and is suitable for robust samples.

Tapping Mode AFM

This technique measures topography by tapping the surface with an oscillating tip. Tapping during scanning eliminates lateral forces that can damage soft samples and reduce image resolution.

Phase Imaging

This technqiue provides image contrast through differences in surface adhesion and viscoelasticity.

Magnetic Force Microscopy (MFM)

This technique is sensitive to the magnetic force gradient distribution above the sample surface.

Lateral Force Microscopy (LFM)

This technique is sensitive to frictional forces between the probe tip and sample surface.

Scanning Tunnelling Microscopy (STM)

This technique is sensitive to the topography of surface electronic states by measuring the tunneling current which is dependent on the separation between the probe tip and a conductive sample surface.

Capability

  • Scanning tunnelling microscopy, STM (ambient and ultra-high vacuum)
  • Atomic force microscopy, AFM (ambient and ultra-high vacuum, physical devices to wet biological samples)
  • Combined SEM/STM (4-point Omicron Multiprobe)

Equipment